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ECEC 513 Design for Testability 3.0 Credits

Economics vs. Complexity vs. Strategy of Testing; Fault Models; Test Generation; Testability Analysis & Designing Testable Circuits; Testing Microprocessors, Memories and Computer Components; Test Data Compression; Fault Tolerant Hardware; Reliably vs. Availability; Redundancy and Error Correcting Codes.

College/Department: College of Engineering
Repeat Status: Not repeatable for credit
Prerequisites: ECEC 511 [Min Grade: C] and ECEC 512 [Min Grade: C]

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