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MATE 541 Introduction to Transmission Electron Microscopy and Related Techniques 3.0 Credits

This course covers fundamentals of electron optics, electron-specimen interaction, and transmission electron microscopy (TEM). Elastic (high resolution and in situ TEM) and inelastic scattering techniques (energy dispersive spectroscopy, electron energy loss speciroscopy) are reviewed. An introduction to scanning electron microscopy ( SEM), focused ion beam (FIB), and sample preparation is provided.

College/Department: College of Engineering
Repeat Status: Not repeatable for credit